12th Annual NATL Conference

We are very grateful to our Sponsor and the Exhibitors for putting on such good displays as can be seen in the following photographs.

John Skidmore of PanametricsNDT, RD-Tech.

John Hansen, Dave Crinson and Peter Sinclair on the GE Inspection Technologies Stand.

David Topp of TSC Inspection Systems.

Dave Griffin and Paul Johnston of Argyll-Ruane Ltd.

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